Partial evaluation based triple modular redundancy for single event upset mitigation

Analysis of Single-Event Upset Rates in Triple-Modular Redundancy Devices

Single Event Upset Mitigation Techniques for SRAM-based FPGAs

This paper discusses high level techniques for designing fault tolerant systems in SRAM-based FPGAs, without modification in the FPGA architecture. TMR has been successfully applied in FPGAs to mitigate transient faults, which are likely to occur in space applications. However, TMR comes with high area and power dissipation penalties. The new technique proposed in this paper was specifically de...

Dynamic Partial based Single Event Upset (SEU) Injection Platform on FPGA

SRAM based FPGAs are attracting considerable interest especially in aerospace applications due to their high reconfigurability, low cost and availability. However, these devices are strongly susceptible to space radiation effects which are able to cause unwanted single event upsets (SEUs) in the configuration memory. In order to mitigate the SEU effects, various methods have been investigated i...

ELZAR: Triple Modular Redundancy using Intel AVX

Instruction-Level Redundancy (ILR) is a well known approach to tolerate transient CPU faults. It replicates instructions in a program and inserts periodic checks to detect and correct CPU faults using majority voting, which essentially requires three copies of each instruction and leads to high performance overheads. As SIMD technology can operate simultaneously on several copies of the data, i...

Single Event Upset (SEU) in SRAM

Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecraft electronics. Transient effects on circuits and systems from high energetic particles can interrupt electronics operation or crash the systems. This phenomenon is particularly serious in complementary metal-oxide-semiconductor (CMOS) integrated circuits (ICs) since most of modern ICs are implem...